Foornada Kobaca Ingot ee SiC ee loogu talagalay Hababka Cabbirka Weyn ee SiC Crystal TSSG/LPE
Mabda'a Shaqada
Mabda'a asaasiga ah ee koritaanka birta silikoon ee marxaladda dareeraha ah waxaa ka mid ah kala dirida walxaha ceeriin ee SiC ee saafiga sare leh ee biraha dhalaalay (tusaale ahaan, Si, Cr) heerkul ah 1800-2100°C si loo sameeyo xalal buuxa, oo ay ku xigto koritaanka jihada la xakameeyey ee kiristaalo keli ah oo SiC ah oo ku yaal kiristaalo abuurka iyada oo loo marayo heerkulka saxda ah iyo nidaaminta supersaturation. Tiknoolajiyaddani waxay si gaar ah ugu habboon tahay soo saarista daahirnimo sare (>99.9995%) kiristaalo keli ah oo 4H/6H-SiC ah oo leh cufnaan cilladaysan oo hooseeya (<100/cm²), iyadoo la buuxinayo shuruudaha substrate-ka adag ee qalabka elektaroonigga korontada iyo aaladaha RF. Nidaamka koritaanka marxaladda dareeraha ah wuxuu suurtogal ka dhigayaa xakamaynta saxda ah ee nooca gudbinta kiristaalka (nooca N/P) iyo iska caabinta iyada oo loo marayo halabuurka xalka ee la hagaajiyay iyo xuduudaha koritaanka.
Qaybaha Muhiimka ah
1. Nidaamka Gaarka ah ee Crucible: Graphite/tantalum-ka isku-dhafan oo saafi ah, iska caabin heerkulka ah > 2200°C, u adkaysta daxalka dhalaalka SiC.
2. Nidaamka Kululaynta Aagag Badan: Kululaynta iska caabbinta/kuleylka kicinta oo isku dhafan oo leh saxnaanta xakamaynta heerkulka oo ah ±0.5°C (1800-2100°C).
3. Nidaamka Dhaqdhaqaaqa Sax ah: Xakamaynta laba-laaban ee loo yaqaan 'closed-wall control' oo loogu talagalay wareegga abuurka (0-50rpm) iyo qaadista (0.1-10mm/h).
4. Nidaamka Xakamaynta Jawiga: Ilaalinta argon/nitrogen-ka oo saafi ah, cadaadis shaqo oo la hagaajin karo (0.1-1atm).
5. Nidaamka Xakamaynta Caqliga leh: PLC+ kontoroolka PC-ga warshadaha oo leh kormeer is-dhexgalka kobaca waqtiga-dhabta ah.
6. Nidaamka Qaboojinta Waxtarka Leh: Naqshadaynta qaboojinta biyaha ee heerka sare ah waxay hubinaysaa hawlgal xasilloon oo muddo dheer ah.
Isbarbardhigga TSSG iyo LPE
| Astaamaha | Habka TSSG | Habka LPE |
| Heerkulka Koritaanka | 2000-2100°C | 1500-1800°C |
| Heerka Kobaca | 0.2-1mm/saacaddii | 5-50μm/saacaddii |
| Cabbirka Kiristarka | 4-8 inji oo ah caleemo waaweyn | Lakabyada epi-ga ee 50-500μm |
| Codsiga ugu Weyn | Diyaarinta substrate-ka | Qalabka korontada ee epi-lakabka |
| Cufnaanta cilladaha | <500/cm² | <100/cm² |
| Noocyada Polytypes ee ku habboon | 4H/6H-SiC | 4H/3C-SiC |
Codsiyada Muhiimka ah
1. Korontada Elektarooniga ah: Substrates 6-inji ah oo 4H-SiC ah oo loogu talagalay 1200V+ MOSFETs/diodes.
2. Qalabka RF ee 5G: Substrate-ka SiC ee nus-daboolaya ee saldhigyada saldhiga.
3. Codsiyada EV: Lakabyo epi-ah oo aad u qaro weyn (>200μm) oo loogu talagalay modules-ka heerka baabuurta.
4. PV Inverters: Substrates-ka cilladaysan oo awood u siinaya hufnaanta beddelka >99%.
Faa'iidooyinka Muhiimka ah
1. Sareeynta Tiknoolajiyadda
1.1 Naqshadeynta Hababka Badan ee Isku-dhafan
Nidaamkan koritaanka ingot-ka ee SiC ee marxaladda dareeraha ah si hal-abuur leh ayuu isugu daraa teknoolojiyada koritaanka kiristaalka TSSG iyo LPE. Nidaamka TSSG wuxuu adeegsadaa kobaca xalka ee ugu sarreeya oo leh kontoroolka dhalaalka saxda ah iyo xakamaynta heerkulka (ΔT≤5℃/cm), taasoo suurtogalinaysa koboc deggan oo ah ingots SiC dhexroor weyn oo 4-8 inji ah oo leh wax-soo-saar hal-socod ah oo ah 15-20kg kiristaallada 6H/4H-SiC. Nidaamka LPE wuxuu adeegsadaa hal-abuurka dareeraha ee la hagaajiyay (nidaamka dahaarka Si-Cr) iyo xakamaynta saturation-ka sare (±1%) si loo kobciyo lakabyada epitaxial qaro weyn oo tayo sare leh oo leh cufnaanta cilladaha <100/cm² heerkulka hooseeya (1500-1800℃).
1.2 Nidaamka Xakamaynta Caqliga leh
Waxaa lagu qalabeeyay xakamaynta kobaca caqliga leh ee jiilka 4aad oo leh:
• La socodka goobaha kala duwan (400-2500nm dhererka hirarka)
• Ogaanshaha heerka dhalaalka ee ku salaysan laysarka (±0.01mm sax ah)
• Xakamaynta wareegga xiran ee ku salaysan CCD (<±1mm isbeddel)
• Hagaajinta halbeegga koritaanka ee ku shaqeeya AI (15% keydinta tamarta)
2. Faa'iidooyinka Waxqabadka Habka
2.1 Habka TSSG Awoodaha Aasaasiga ah
• Awood cabbir weyn: Waxay taageertaa korriin kiristaal ah oo ilaa 8 inji ah oo leh >99.5% isku mid ah dhexroorka
• Crystallinity Sare: Cufnaanta kala-baxa <500/cm², cufnaanta dhuumaha yar <5/cm²
• Isku mid ahaanshaha daawada: <8% kala duwanaanshaha iska caabinta nooca n (4-inji wafers)
• Heerka koritaanka ee la hagaajiyay: La hagaajin karo 0.3-1.2mm/saacaddii, 3-5× ka dhaqso badan hababka wejiga uumiga
2.2 Habka LPE Awoodaha Aasaasiga ah
• Epitaxy cillad aad u hooseeya: Cufnaanta xaaladda is-dhexgalka <1×10¹¹cm⁻²·eV⁻¹
• Xakamaynta dhumucda saxda ah: 50-500μm epi-layer oo leh kala duwanaansho dhumucda <±2%
• Waxtarka heerkulka hooseeya: 300-500℃ ka hooseeya hababka CVD
• Kobaca qaab-dhismeedka adag: Waxay taageertaa isgoysyada pn, superlattices, iwm.
3. Faa'iidooyinka Waxtarka Wax Soo Saarka
3.1 Xakamaynta Qiimaha
• 85% isticmaalka walxaha ceeriin ah (marka la barbar dhigo 60% caadiga ah)
• Isticmaalka tamarta oo 40% ka hooseeya (marka la barbar dhigo HVPE)
• 90% waqtiga qalabka la shaqeynayo (naqshadeynta qaabaysan waxay yareysaa waqtiga shaqada)
3.2 Hubinta Tayada
• Xakamaynta habka 6σ (CPK>1.67)
• Ogaanshaha cilladaha khadka tooska ah (xalinta 0.1μm)
• Raad-raaca xogta habka buuxa (2000+ xuduudo waqtiga dhabta ah)
3.3 Cabbiraadda
• La jaan qaadaya noocyada polytypes-ka 4H/6H/3C
• La cusboonaysiin karo qaybaha habka 12-inji ah
• Waxay taageertaa isdhexgalka isku-dhafka ah ee SiC/GaN
4. Faa'iidooyinka Codsiga Warshadaha
4.1 Qalabka Korontada
• Substrate-yada iska caabinta hooseeya (0.015-0.025Ω·cm) ee aaladaha 1200-3300V
• Substrate-ka nus-daboolaya (>10⁸Ω·cm) ee loogu talagalay codsiyada RF
4.2 Teknoolojiyada Soo Kordhaysa
• Isgaarsiinta Quantum: Substrate-yada buuqa aadka u hooseeya (1/f buuq <-120dB)
• Deegaanno aad u daran: Kiristarro u adkaysta shucaaca (<5% burbur ka dib shucaaca 1×10¹⁶n/cm²)
Adeegyada XKH
1. Qalabka La Habeeyey: Qaababka nidaamka TSSG/LPE ee loo habeeyey.
2. Tababarka Geeddi-socodka: Barnaamijyo tababar farsamo oo dhammaystiran.
3. Taageerada iibka kadib: Jawaabta farsamada iyo dayactirka 24/7.
4. Xalalka Turnkey: Adeeg buuxa oo muuqaal ah laga bilaabo rakibidda ilaa xaqiijinta habka.
5. Sahayda Agabka: Substrates-ka SiC ee 2-12 inji/epi-wafers ayaa la heli karaa.
Faa'iidooyinka ugu muhiimsan waxaa ka mid ah:
• Awoodda koritaanka kiristaalka ilaa 8 inji.
• Isku mid ahaanshaha iska caabbinta <0.5%.
• Waqtiga shaqada qalabka >95%.
• Taageero farsamo oo 24/7 ah.









