4H-N 8 inch SiC substrate wafer Silicon Carbide Dummy darajo cilmi baaris 500um dhumucdiisuna
Sideed u Doorataa Wafers Silicon Carbide & Substrates SiC?
Markaad dooranayso waferrada silikoon carbide (SiC) iyo substrates, waxaa jira dhowr arrimood oo la tixgeliyo. Waa kuwan qaar ka mid ah shuruudaha muhiimka ah:
Nooca Walxaha: Go'aami nooca SiC ee ku habboon codsigaaga, sida 4H-SiC ama 6H-SiC. Qaab dhismeedka ugu badan ee la isticmaalo waa 4H-SiC.
Nooca Doping: Go'aanso haddii aad u baahan tahay substrate SiC ah oo la sameeyay ama aan la taaban. Noocyada doping-ga caadiga ah waa N-nooca (n-doped) ama P-nooca (p-doped), taas oo ku xidhan shuruudahaaga gaarka ah.
Tayada Crystal: Qiimee tayada muraayada ee SiC wafers ama substrates. Tayada la rabo waxaa lagu go'aamiyaa cabirrada sida tirada cilladaha, jihaynta crystallographic, iyo qallafsanaanta dusha sare.
Dhexroorka Wafer: Dooro cabbirka wafer ee ku habboon codsigaaga. Cabbirrada caadiga ah waxaa ka mid ah 2 inji, 3 inji, 4 inji, iyo 6 inji. Inta uu bato dhexroorku, waxa badan oo aad ka heli kartaa waferkiiba.
Dhumucda: Tixgeli dhumucda la rabo ee maraqa SiC ama substrates. Xulashada dhumucda caadiga ah waxay u dhaxaysaa dhowr mikromitir ilaa dhowr boqol oo mikromitir.
Jihaynta: Go'aami hanuuninta crystallographic ee ku habboon shuruudaha codsigaaga. Hanuuninta guud waxaa ka mid ah (0001) ee 4H-SiC iyo (0001) ama (0001̅) ee 6H-SiC.
Dhammaystirka dusha sare: Qiimee dhammaadka dusha sare ee waferrada SiC ama substrates. Dusha sare waa in ay ahaataa mid siman, oo dhalaalaya, oo ka nadiif ah xagashada ama wasakhowga.
Sumcada Alaab-qeybiyaha: Dooro alaab-qeybiye sumcad leh oo khibrad dheer u leh soo saarista maraqa iyo substrate-ka tayada sare leh ee SiC Tixgeli arrimo ay ka mid yihiin awoodaha wax soo saarka, xakamaynta tayada, iyo dib u eegista macaamiisha.
Qiimaha: Tixgeli saamaynta qiimaha, oo ay ku jiraan qiimaha waferka ama substrate-ka iyo kharashyada habaynta dheeraadka ah.
Waa muhiim inaad si taxadar leh u qiimeyso arrimahan oo aad la tashato khabiirada warshadaha ama alaab-qeybiyeyaasha si loo hubiyo in waferrada SiC ee la doortay iyo substrate-yada ay buuxiyaan shuruudahaaga gaarka ah.