N-Nooca SiC on Si Composite Substrates Dia6inch

Sharaxaad Gaaban:

N-Nooca SiC on Si ka kooban substrates waa qalab semiconductor ah oo ka kooban lakabka n-nooca silicon carbide (SiC) oo lagu shubay substrate silikoon (Si).


Faahfaahinta Alaabta

Tags Product

等级Darajo

U 级

P级

D级

Heerka BPD hooseeya

Heerka Wax-soo-saarka

Dummy Fasalka

直径Dhexroorka

150.0 mm±0.25mm

厚度Dhumucda

500 μm±25μm

晶片方向Hanuuninta Wafer

Xagasha ka baxsan : 4.0 ° dhanka <11-20> ± 0.5° ee 4H-N dhidibka : <0001>±0.5° ee 4H-SI

主定位边方向Guriga Hoose

{10-10}±5.0°

主定位边长度Dhererka Guriga aasaasiga ah

47.5 mm±2.5 mm

边缘Ka saarida gees

3 mm

总厚度变化/弯曲度/翘曲度 TTV/Bow /Warp

≤15μm /≤40μm/≤60μm

微管密度和基面位错MPD&BPD

MPD≤1 cm-2

MPD≤5 cm-2

MPD≤15 cm-2

BPD≤1000cm-2

电阻率iska caabin

≥1E5 Ω·cm

表面粗糙度Qalafsanaan

Polish Ra≤1 nm

CMP Ra≤0.5 nm

裂纹(强光灯观测) #

Midna

Dhererka isugeynta ≤10mm, hal dherer≤2mm

Dildilaaca iftiinka xoogga sare

六方空洞(强光灯观测)*

Aagga isugeynta ≤1%

Aagga isugeynta ≤5%

Hex Plates oo leh iftiin xoogan oo sarreeya

多型(强光灯观测)*

Midna

Aagga isugeynta≤5%

Noocyada kala duwan ee iftiinka xoogga badan

划痕(强光灯观测)*&

3 xagtin ilaa 1× dhexroorka wafer

5 xagtin ilaa 1× dhexroorka wafer

Xariiro iftiinka xoogga sare leh

dhererka isugeynta

dhererka isugeynta

崩边# Chip Edge

Midna

5 waa la ogol yahay, ≤1 mm midkiiba

表面污染物(强光灯观测)

Midna

Wasakhaynta iftiinka xoogga badan

 

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